发明名称 FUNDUS EXAMINATION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a fundus examination apparatus easily and highly precisely measuring the thickness of the optic nerve fiber layer. <P>SOLUTION: A Stokes vector computing section 53 finds Stokes vector based on a signal acquired by a fundus examination section 60. A phase difference distribution computing section 54 finds a phase difference distribution of a fundus reflection light by a specific area (Henle's outer fiber layer) of the fundus based on the Stokes vector. An anterior segment slow phase axis computing section 55 and an anterior segment phase difference computing section 56 find anterior segment components (a slow phase axis of the anterior segment and a phase difference caused by the anterior segment) based on the phase difference distribution. An NFL (Nerve Fiber Layer) component extraction section 57 extracts the NFL component from the polarization state of the fundus reflection light based on the anterior segment component. The NFL thickness computing section 58 computes the thickness of the stratum opticum based on the NFL component. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008264048(A) 申请公布日期 2008.11.06
申请号 JP20070107777 申请日期 2007.04.17
申请人 CHIBA UNIV;TOPCON CORP 发明人 ONUMA KAZUHIKO;OKAZAKI YOSHIRO;FUKUMA YASUFUMI;SHIOIRI TAKASHI
分类号 A61B3/12 主分类号 A61B3/12
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