发明名称 Positive resist compositions and patterning process
摘要 A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid and (B) an acid generator. The resin (A) is a polymer comprising specific recurring units. The acid generator (B) is a specific sulfonium salt compound. When processed by lithography, the composition is improved in resolution, and forms a pattern with a minimal line edge roughness.
申请公布号 US2008268370(A1) 申请公布日期 2008.10.30
申请号 US20070984608 申请日期 2007.11.20
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TANAKA SHIGEO;SEKI AKIHIRO;TAKEMURA KATSUYA;NISHI TSUNEHIRO
分类号 G03F7/004;G03F7/20 主分类号 G03F7/004
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