| 摘要 |
Disclosed is a test head comprising: a supporting member configured on an end face of a test head housing on a side of connection with a device under test; a pin electronics circuit disposed in the test head housing, the pin electronics circuit outputting a test signal; flexible wiring including one end connected to the pin electronics circuit and another end provided to elongate onto the supporting member on an outside of the test head housing; and a connection section with a side of the device under test, the connection section annexed on the other end of the flexible wiring, wherein a load loaded at a time of connection of the device under test to the connection section is supported by the supporting member.
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