Semiconductor integrated circuit and method of testing same

摘要

A semiconductor integrated circuit includes S PLLs (S is an integer satisfying S>=2), and the (k-1)th PLL 12_(k-1) (k is an integer satisfying 2<=k<=S) is connected to the kth PLL 12_k in the test mode. In this manner, the examination of S PLLs can be performed in a single test, and thereby it can reduce the time needed to examine PLLs for the in semiconductor integrated circuit having a plurality of PLLs.