发明名称 Method for Manufacturing Semiconductor Device
摘要 The present invention is a method of manufacturing a semiconductor device from a layered body including: a semiconductor substrate; a high dielectric film formed on the semiconductor substrate; and an SiC-based film formed on a position upper than the high dielectric film, the SiC-based film having an anti-reflective function and a hardmask function. The present invention comprises a plasma-processing step for plasma-processing the SiC-based film and the high dielectric film to modify the SiC-based film and the high dielectric film by an action of a plasma; and a cleaning step for wet-cleaning the SiC-based film and the high dielectric film modified in the plasma-processing step to collectively remove the SiC-based film and the high dielectric film.
申请公布号 US2008268655(A1) 申请公布日期 2008.10.30
申请号 US20050794325 申请日期 2005.11.29
申请人 GALE GLENN;HIROTA YOSHIHIRO;MURAKI YUSUKE;NAKAMURA GENJI;KUSHIBIKI MASATO;SHINDO NAOKI;SHIMIZU AKITAKA;ASHIGAKI SHIGEO;KATO YOSHIHIRO 发明人 GALE GLENN;HIROTA YOSHIHIRO;MURAKI YUSUKE;NAKAMURA GENJI;KUSHIBIKI MASATO;SHINDO NAOKI;SHIMIZU AKITAKA;ASHIGAKI SHIGEO;KATO YOSHIHIRO
分类号 H01L21/469;H01L21/00 主分类号 H01L21/469
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