发明名称 METHOD AND SYSTEM FOR EVALUATING A VARIATION IN A PARAMETER OF A PATTERN
摘要 <p>A method and system are presented for evaluating a variation of a parameter of a pattern. The method includes processing data indicative of an aerial intensity image of at least a portion of a patterned article, and determining values of a certain functional of the aerial image intensity for predetermined regions within the at least portion of the patterned article. The values of the aerial image intensity functional are indicative of a variation of at least one parameter of the pattern within the at least portion of the patterned article or are indicative of a variation of at least one parameter of a pattern manufactured by utilizing the patterned article.</p>
申请公布号 EP1984895(A2) 申请公布日期 2008.10.29
申请号 EP20070706073 申请日期 2007.02.01
申请人 APPLIED MATERIALS ISRAEL LTD. 发明人 BEN YISHAI, MICHAEL;WAGNER, MARK;BARTOV, AVISHAI;GREENBERG, GAD;SHOVAL, LIOR;GVIRTZER, OPHIR
分类号 G06K9/00 主分类号 G06K9/00
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