发明名称 Grayscale reticle for precise control of photoresist exposure
摘要 A method of fabricating a grayscale reticule includes preparing a quartz substrate; depositing a layer of silicon-rich oxide on the quartz substrate; depositing a layer of silicon nitride as an oxidation barrier layer on the silicon-rich oxide layer; depositing and patterning a layer of photoresist; etching the silicon nitride layer with a pattern for the silicon nitride layer; removing the photoresist; cleaning the quartz substrate and the remaining layers; oxidizing the quartz substrate and the layers thereon, thereby converting the silicon-rich oxide layer to a transparent silicon dioxide layer; removing the remaining silicon nitride layer; forming the quartz substrate and the silicon dioxide thereon into a reticule; and using the reticule to pattern a microlens array.
申请公布号 US7439187(B2) 申请公布日期 2008.10.21
申请号 US20060588891 申请日期 2006.10.27
申请人 SHARP LABORATORIES OF AMERICA 发明人 ONO YOSHI;ULRICH BRUCE D.;JOSHI POORAN CHANDRA
分类号 H01L21/00;H01L21/302 主分类号 H01L21/00
代理机构 代理人
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