发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING RESIST PATTERN USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition from which a fine resist pattern with a large film thickness and a high aspect ratio can be formed without generating variance in the pattern dimension by improving coating uniformity, and to provide a device for MEMS (microelectro-mechanical system) in which the resist pattern is incorporated as a component. <P>SOLUTION: The photosensitive resin composition having improved coating uniformity and giving a fine resist pattern with a large film thickness and a high aspect ratio is obtained by adding a silicone-based surfactant into a photosensitive resin composition containing a polyfunctional epoxy resin and a cation polymerization initiator. The device for a MEMS includes the above resist pattern as a component. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2008250200(A) |
申请公布日期 |
2008.10.16 |
申请号 |
JP20070094232 |
申请日期 |
2007.03.30 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
YONEKURA JUNZO;SENZAKI TAKAHIRO;YAMANOUCHI ATSUSHI;SAITO KOJI |
分类号 |
G03F7/004;G03F7/029;G03F7/038;G03F7/20 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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