发明名称 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING RESIST PATTERN USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a photosensitive resin composition from which a fine resist pattern with a large film thickness and a high aspect ratio can be formed without generating variance in the pattern dimension by improving coating uniformity, and to provide a device for MEMS (microelectro-mechanical system) in which the resist pattern is incorporated as a component. <P>SOLUTION: The photosensitive resin composition having improved coating uniformity and giving a fine resist pattern with a large film thickness and a high aspect ratio is obtained by adding a silicone-based surfactant into a photosensitive resin composition containing a polyfunctional epoxy resin and a cation polymerization initiator. The device for a MEMS includes the above resist pattern as a component. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008250200(A) 申请公布日期 2008.10.16
申请号 JP20070094232 申请日期 2007.03.30
申请人 TOKYO OHKA KOGYO CO LTD 发明人 YONEKURA JUNZO;SENZAKI TAKAHIRO;YAMANOUCHI ATSUSHI;SAITO KOJI
分类号 G03F7/004;G03F7/029;G03F7/038;G03F7/20 主分类号 G03F7/004
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