发明名称 EVALUATION METHOD FOR SOLDER JUNCTION PART
摘要 PROBLEM TO BE SOLVED: To provide an evaluation method for a solder junction part advantageous for evaluating a life of the solder junction part. SOLUTION: A base body with the solder junction part is prepared in this evaluation method. The solder junction part is applied with thermal shocks many times. A change of a grain size in a crystal based on the thermal shocks is found in the solder junction part, and the life of the solder junction part is evaluated based on the change of the grain size in the crystal. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008249613(A) 申请公布日期 2008.10.16
申请号 JP20070093762 申请日期 2007.03.30
申请人 AISIN SEIKI CO LTD;TOYOTA CENTRAL R&D LABS INC 发明人 KOIKE YOJI;MATSUMOTO AKIKAZU;YAGI WATARU;ISOTANI TAKESHI;HIROSE MIHARU;KADOURA HIROAKI;SEKI JUNTARO;TAKAO HISAFUMI
分类号 G01N17/00;G01N3/60 主分类号 G01N17/00
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