发明名称 Semiconductor Device and Manufacturing Method Thereof
摘要 Manufacture of TFTs corresponding to various circuits makes structures thereof complex, which involves a larger number of manufacturing steps. Such an increase in the number of the manufacturing steps leads to a higher manufacturing cost and a lower manufacturing yield. In the invention, a high concentration of impurities is doped by using as masks a tapered resist that is used for the manufacture of a tapered gate electrode, and the tapered gate electrode, and then the tapered gate electrode is etched in the perpendicular direction using the resist as a mask. A semiconductor layer under the thusly removed tapered portion of the gate electrode is doped with a low concentration of impurities.
申请公布号 US2008251845(A1) 申请公布日期 2008.10.16
申请号 US20080116384 申请日期 2008.05.07
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OKAMOTO SATORU
分类号 H01L29/00;G02F1/136;G09G3/38;H01L21/00;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L29/00
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