发明名称 PARTICLE INSPECTION DEVICE FOR CONVEYOR ESTABLISHMENT
摘要 A particle inspecting apparatus for conveyer installation is provided to inspect particles protruded from a flat plate display device by a predetermined height by irradiating light to the flat plate display device through illumination unit and to save production time by inspecting the flat plate display device being moving. A particle inspecting apparatus for conveyer installation includes a camera(110), an LED illumination device, a laser generator and a reflection mirror(130). The camera is provided in an upper side of a flat plate display panel(10), photographs light supplied from the LCD illumination device and reflected from the flat plate display panel or light supplied from the laser generator and reflected from particles present on the flat plate display panel. The LED illumination device is provided in a direction corresponding to the camera and supplies light amount necessary for photographing of the camera. The laser generator is provide parallel with the camera, and supplies light amount necessary for photographing of the camera. The reflection mirror refracts the light from the LED illumination device at a predetermined angle and irradiates it to the flat plate display device.
申请公布号 KR100863340(B1) 申请公布日期 2008.10.15
申请号 KR20080019225 申请日期 2008.02.29
申请人 WEIS PLANET CO., LTD. 发明人 HONG, KI HYUN;NA, SANG CHAN;KIM, TAE HONG
分类号 G02F1/13 主分类号 G02F1/13
代理机构 代理人
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