| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and its test method which enable setting of a register in EMRS, without increasing the number of fields of a register and without using a complicated circuit in register setting of MRS, as this invention is made in view of such a condition. SOLUTION: The semiconductor device of this invention has a parallel test mode which connect same functional terminals in each of a plurality of semiconductor devices in common, and perform a test of this semiconductor device. The semiconductor device has; a mode register which sets test mode information and operating mode information which specify operation of the semiconductor device; a determination circuit which detects whether or not the test mode information input into the register is a parallel test mode; a test circuit which performs test operation according to the operating mode information in pin assignment corresponding to a parallel test mode when it is detected that the test mode information is the parallel test mode. COPYRIGHT: (C)2009,JPO&INPIT
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