发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 A nonvolatile semiconductor memory device and a manufacturing method thereof are provided to prevent a memory cell adjacent to a selection transistor from having different characteristics from another memory cell. A memory cell column is formed by connecting a plurality of memory cells in series. Each memory cell includes a structure where a charge storage layer and a control gate are stacked through an insulation layer on a semiconductor substrate(11). A first selection transistor(ST1) is formed on the semiconductor substrate and is connected between one end of the memory cell column and a common source line. A second selection transistor is formed on the semiconductor substrate and is connected between the other end of the memory cell column and a bit line.
申请公布号 KR20080091031(A) 申请公布日期 2008.10.09
申请号 KR20080031804 申请日期 2008.04.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KONDO MASAKI;IZUMIDA TAKASHI;AOKI NOBUTOSHI;WATANABE TOSHIHARU
分类号 G11C16/02 主分类号 G11C16/02
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