发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
A nonvolatile semiconductor memory device and a manufacturing method thereof are provided to prevent a memory cell adjacent to a selection transistor from having different characteristics from another memory cell. A memory cell column is formed by connecting a plurality of memory cells in series. Each memory cell includes a structure where a charge storage layer and a control gate are stacked through an insulation layer on a semiconductor substrate(11). A first selection transistor(ST1) is formed on the semiconductor substrate and is connected between one end of the memory cell column and a common source line. A second selection transistor is formed on the semiconductor substrate and is connected between the other end of the memory cell column and a bit line.
|
申请公布号 |
KR20080091031(A) |
申请公布日期 |
2008.10.09 |
申请号 |
KR20080031804 |
申请日期 |
2008.04.04 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KONDO MASAKI;IZUMIDA TAKASHI;AOKI NOBUTOSHI;WATANABE TOSHIHARU |
分类号 |
G11C16/02 |
主分类号 |
G11C16/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|