| 摘要 |
PROBLEM TO BE SOLVED: To achieve an inspection device for inspecting the quality of a solid-state imaging device by detecting, even stain defects with low contrast at a periphery of an image, which has been impossible to detect by conventional inspection devices. SOLUTION: An inspection circuit 30 calculates a moving average value with a different number of samples in each luminance signal, respectively, from the luminance signals of a horizontal pixel of an image sensor 50 to be inspected. The stain defect is detected, and the quality of the image sensor 50 is determined, depending whether a difference between the moving average values with the different number of samples is not smaller than a prescribed value, and whether the state with the difference continues beyond the predetermined number of states. COPYRIGHT: (C)2009,JPO&INPIT |
