| 摘要 |
There is disclosed a test head device for testing the functionality of a large number of RFID chips arranged in smart labels ( 17 ) within a smart label production apparatus by means of a data reading and/or data writing process, wherein the smart labels ( 17 ), each comprising a first antenna ( 10 a- 10 e), are placed next to and behind one another on a common continuously moving strip, wherein the test head device comprises a plurality of test systems which function independently of one another, each of said test systems consisting of a write and/or read unit ( 12 a-e), a second antenna ( 3, 11 a-e; 18 ) connected thereto which is in each case assigned to one of the first antennas ( 10 a- 10 e) for simultaneously transmitting read and/or write data between the first and second antennas ( 10 a- 10 e; 3; 11 a-e; 18 ) by means of ultrahigh frequency waves, and a common table unit which can be displaced at least in the height direction, wherein the second antennas ( 3; 11 a-e; 18 ) are arranged on a common antenna carrier plate ( 2 ) oriented parallel to the strip.
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