发明名称 POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad which can keep its dimensional stability high in absorbing moisture or water and has high polishing speed, a manufacturing method thereof, and a method for manufacturing a semiconductor device using the polishing pad. <P>SOLUTION: In this polishing pad having a polishing layer made of polyurethane foam having microbubbles, the polyurethane foam includes (1) isocyanate-terminated prepolymer A containing isocyanate monomer, high molecular weight polyol &alpha;, and low molecular weight polyol, (2) isocyanate-terminated prepolymer B containing polymerized diisocyanate and polyethylene glycol with number average molecular weight of 200-1000, and (3) a reaction hardened body reacted with a chain extending agent. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008238361(A) 申请公布日期 2008.10.09
申请号 JP20070084785 申请日期 2007.03.28
申请人 TOYO TIRE & RUBBER CO LTD 发明人 NAKAI YOSHIYUKI;KAZUNO ATSUSHI;KIMURA TAKESHI;SHIMOMURA TETSUO;OGAWA KAZUYUKI
分类号 B24B37/24;C08G18/12;C08G18/65;H01L21/304 主分类号 B24B37/24
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