发明名称 TIME DELAY MEASUREMENT
摘要 A method of processing first and second corresponding signals having a de lay therebetween, at least the first signal being a binary signal having chi p boundaries, comprises: introducing a plurality of different delays between the first and second signals, successive delay amounts differing from each other by less than the interval between chip boundaries, and for each introd uced delay, summing samples of the second signal which are obtained at the t imes of, at least, chip boundaries between bits of the first signal which ha ve the same state, to obtain a value; thereby to obtain a representation of how the value varies according to the introduced delay, which representation contains a level change associated with an introduced delay which bears a p redetermined relationship to the delay between the first and second signals.
申请公布号 CA2681604(A1) 申请公布日期 2008.10.09
申请号 CA20082681604 申请日期 2008.03.27
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 CHEN, NONGJI
分类号 G01S19/30 主分类号 G01S19/30
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