发明名称 |
Test card for testing e.g. programmable logic array, has contact test piece comprising drill bit that is equipped with cutting edge, where device allows drill bit to penetrate into semiconductor component |
摘要 |
<p>The device has a contact test piece for contacting a semiconductor component (8) e.g. programmable logic array, where the contact test piece exhibits a drill bit. A torsion spring exhibits two carriers that are connected by screw-shaped arranged rods. The drill bit is equipped with a cutting edge, where the device allows the drill bit to penetrate into the semiconductor component. The drill bit is connected with the torsion spring that produces a rotation about a shifting direction of the contact test piece. An independent claim is also included for a method for testing a semiconductor component.</p> |
申请公布号 |
DE102007015284(A1) |
申请公布日期 |
2008.10.02 |
申请号 |
DE20071015284 |
申请日期 |
2007.03.29 |
申请人 |
QIMONDA AG |
发明人 |
HARTMANN, UDO;PIETZSCHMANN, FRANK |
分类号 |
G01R31/28;G11C29/56;H01L21/66;H01R11/18 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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