发明名称 VISUAL EXAMINATION METHOD AND VISUAL EXAMINATION DEVICE
摘要 PROBLEM TO BE SOLVED: To accurately detect flaws inclusive of the peripheral edge part of an inspection target, even when the peripheral edge part has a curved surface in a visual examination method and in a visual examination device. SOLUTION: An inspection target image P0 including a curved surface part is obtained (S101) and a differential image P1 is obtained from the inspection target image (S102). A binarized image P2 is obtained by extracting end part pixels becoming a predetermined differential value or higher from the respective pixels on the differential image P1 (S103). The region connected by the respective end part pixels is set to an end part region (S104), and a first boundary line comprising the pixels on the end side of the inspection target and a second boundary line, comprising the pixels inside the inspection target are determined in the end part region (S105). The first inspection region A1 on the end part side and the second inspection region A2 on the inner inside are determined, on the basis of the respective boundary lines (S106). Flaw inspection is performed under inspection conditions, respectively different in the respective inspection conditions A1 and A2. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008233107(A) 申请公布日期 2008.10.02
申请号 JP20080156724 申请日期 2008.06.16
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 MASUDA TAKESHI;SHIRASAWA MITSURU
分类号 G01N21/88;G06T1/00 主分类号 G01N21/88
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