| 摘要 |
<p>A tester for testing a device under test is provided. The tester comprises a timing data output section for outputting timing data for setting a change timing of a test signal supplied to the device under test and at least one timing of the acquisition timing of an output signal outputted by the device under test, a variable delay circuit for delaying the amount of the delay corresponding to delay data in which a pulse of the reference clock of the tester is specified to generate a timing signal having the change point corresponding to the timing, and a range changing section for changing the amount that the delay data changes in the case where the timing data changes by one unit in response to a change in the setting range in which the timing is set.</p> |
