发明名称 |
PATTERN CORRECTION APPARATUS AND PATTERN CORRECTION METHOD |
摘要 |
<p>A pattern correction apparatus and a method thereof are provided to correct an electrode breaking part or the like through a thin line of about 10‘í by using a film as a mask. A film supply unit refolds a band shaped film(3) to be disposed up and down, and supplies the film to an upper side of a substrate(1). A moving unit moves a part of an upper film of the film to expose a mask pattern formed in a lower film. Each mask pattern has at least one through hole(3a) as being formed in a shape corresponding to a defect part(2a). A location determining unit makes the mask pattern face the defect part as leaving a space for a predetermined gap. An applying unit(9) presses the lower film onto the substrate within a predetermined range including the hole, and applies correction paste(10) to the defect part through the mask pattern.</p> |
申请公布号 |
KR20080087668(A) |
申请公布日期 |
2008.10.01 |
申请号 |
KR20080021826 |
申请日期 |
2008.03.10 |
申请人 |
NTN CORPORATION |
发明人 |
KOIKE TAKASHI;SHIMIZU SHIGEO |
分类号 |
G02F1/13;B23K26/38;H01L21/027 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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