发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device is provided to reduce the variation of termination resistance due to temperature variation. A temperature compensation voltage generation part(100) generates a temperature compensation voltage corresponding to temperature variation. An impedance matching part(200) supplies impedance corresponding to a pull-up control signal and a pull-down control signal, and compensates the variation of the impedance by using the temperature compensation voltage. The impedance matching part includes a pull-up part(210), a pull-down part(220) and a temperature compensation part(230). The pull-up part performs pull-up driving of an output stage in response to the pull-up control signal. The pull-down part performs pull-down driving of the output stage in response to the pull-down control signal. The temperature compensation part adjusts the impedance by changing a current according to the temperature compensation voltage.
申请公布号 KR100861180(B1) 申请公布日期 2008.09.30
申请号 KR20070065426 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JONG HO
分类号 G11C7/10 主分类号 G11C7/10
代理机构 代理人
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