| 摘要 |
A test assistor for a test tray is provided to fix semiconductor devices without a separate package cover through once operation of first and second pressing units. A test assistor for a test tray includes a body and first and second pressing units(130a,130b). The body has a through hole(111) at a center and mounting grooves on a lower surface to mount a pair of semiconductor devices. The first and second pressing units are positioned inside the through hole and press the semiconductor devices through elastic force applied from a center part of the body to both sides. The first and second pressing units have first and second pressing members(131a,131b) closely adhered to one sides of the semiconductor devices, first and second sliding members(132a,132b) horizontally coupled with the first and second pressing members, and first and second operation members(133a,133b) coupled with the first and second sliding members or the first and second pressing members. |
