发明名称 |
Flash memory and method for checking status register by block unit |
摘要 |
Provided is a test method of a NAND flash memory. The method includes programming a page of a selected memory block in the flash memory; accumulating a program result of the page; and repeating the programming of other pages and the accumulating of the program result of the other pages until all pages in the selected memory block are programmed.
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申请公布号 |
US2008225598(A1) |
申请公布日期 |
2008.09.18 |
申请号 |
US20080075398 |
申请日期 |
2008.03.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG JIN-SUNG;KIM JONG-KOOK |
分类号 |
G11C16/34;G11C29/44 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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