发明名称 CIRCUIT AND METHOD FOR SAMPLING VALID COMMAND USING EXTENDED VALID ADDRESS WINDOW IN DOUBLE PUMPED ADDRESS SCHEME MEMORY DEVICE
摘要 Provided are a circuit and method for sampling a valid command using a valid address window extended for a high-speed operation in a double pumped address scheme memory device. A method for extending the valid address window includes: inputting a valid command signal and a first address signal at the first cycle of a clock signal; inputting a second address signal at the second cycle of the clock signal; generating a decoded command signal and extended first and second internal address signals respectively in response to the command signal and the address signals; and latching and decoding the extended first and second internal address signals in response to the decoded command signal.
申请公布号 US2008225626(A1) 申请公布日期 2008.09.18
申请号 US20080128464 申请日期 2008.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM HYUN-JIN;JANG SEONG-JIN;LIM JEONG-DON;PARK KWANG-IL;SONG HO-YOUNG;LEE WOO-JIN
分类号 G11C8/10 主分类号 G11C8/10
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