发明名称 MID-CHAMBER GAS DISTRIBUTION PLATE, TUNED PLASMA CONTROL GRID AND ELECTRODE
摘要 A plasma reactor is provided for processing a workpiece such as a semiconductor wafer or a dielectric mask. The reactor chamber has a ceiling, a side wall and a workpiece support pedestal inside the chamber and facing the ceiling along an axis of symmetry and defining a chamber volume between the pedestal and the ceiling. An RF plasma source power applicator is provided at the ceiling. An in-situ electrode body inside the chamber lies divides the chamber into upper and lower chamber regions. The in-situ electrode comprises plural flow- through passages extending parallel to the axis and having different opening sizes, the passages being radially distributed by opening size in accordance with a desired radial distribution of gas flow resistance through the in-situ electrode body.
申请公布号 WO2008070181(A3) 申请公布日期 2008.09.18
申请号 WO2007US25090 申请日期 2007.12.05
申请人 APPLIED MATERIALS, INC. 发明人 PATERSON, ALEXANDER, M.;HOLLAND, JOHN, P.;PANAGOPOULOS, THEODOROS;HAMMOND, EDWARD, P., IV;HATCHER, BRIAN, K.;TODOROW, VALENTIN, N.;KATZ, DAN
分类号 C23C16/509;C23F1/00 主分类号 C23C16/509
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