| 摘要 |
An interconnection element for probing an electric component is provided to decrease an inspection error by adjusting structural factors of the interconnection element to be similar to each other. An interconnection element is semi-permanently coupled with a junction region of a first electronic component and temporarily contacted with an electrical pad of a second electronic component. The interconnection element includes a fixing region(31), an elongation region(32), and a contact region(33). The fixing region is coupled with the junction region of the first electronic component. The elongation region is elongated along a planar surface of the first electronic component from the fixing region. The contact region is coupled with a portion of the elongation region and has a horizontal elongation length and a vertical height, which is elongated toward the electrode pad. The horizontal elongation length is determined by a length of the elongation region, such that the same contact pressures are applied on the respective contact elements. The contact region includes a base(332) and a contact tip(331). |
