发明名称 System for inspecting a disk-shaped object
摘要 A system for inspecting a disc-shaped substrate 5 is disclosed. The system 100 is surrounded by a housing. A table 2 that is movable in at least an X-direction and a Y-direction and is borne by a mounting plate 22 is provided within the housing 50 . The mounting plate 22 is vibration isolated in comparison to the housing 50 . Equally, an exhaust unit 40 is provided beneath the mounting plate 22 and arranged at a distance from it. The exhaust unit 40 possesses an opening 36 for air entry. The opening 36 for air entry is provided in the exhaust unit between an end of the mounting plate 22 and a wall of the housing 50.
申请公布号 US7426024(B2) 申请公布日期 2008.09.16
申请号 US20050317371 申请日期 2005.12.22
申请人 VISTEC SEMICONDUCTOR SYSTEMS JENA GMBH 发明人 HILTAWSKI, LEGAL REPRESENTATIVE MAGDALENA I.;HILTAWSKI, LEGAL REPRESENTATIVE FRANK A.;SCHENCK RENE
分类号 G01M99/00;G01N21/00 主分类号 G01M99/00
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