发明名称 |
MASK AND METHOD FOR MANUFACTURING A POLY SILICON SUBSTRATE USING THE SAME |
摘要 |
<p>A mask and a poly silicon substrate manufacturing method using the same are provided to manufacture a poly silicon substrate by forming first and second slits of a wave shape in the mask, thereby forming particle boundary lines of a wave shape on the poly silicon substrate and preventing moire. Plural first slits(410) are formed in a wave shape, and spaced from each other in parallel at predetermined intervals. Plural second slits(420) are formed in an area adjacent to the first slits so as to correspond to a space between the first slits, and formed in the same shape as the first slit. The first and second slits have the same width. The first slit has a sine wave shape.</p> |
申请公布号 |
KR20080080791(A) |
申请公布日期 |
2008.09.05 |
申请号 |
KR20070020967 |
申请日期 |
2007.03.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, MYUNG KOO |
分类号 |
G02F1/136;H01L21/027;H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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