发明名称 X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
摘要 In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.
申请公布号 US2008212739(A1) 申请公布日期 2008.09.04
申请号 US20080972337 申请日期 2008.01.10
申请人 FUKAI TAKAYUKI;MATOBA YOSHIKI;HASEGAWA KIYOSHI 发明人 FUKAI TAKAYUKI;MATOBA YOSHIKI;HASEGAWA KIYOSHI
分类号 G01N23/201 主分类号 G01N23/201
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