发明名称 Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor
摘要 The aim of the invention is to determine the refractive index and/or compensation of the influence of the refractive index during interferometric length measurement with the aid of an interferometer ( 13, 13' ) impinged upon by at least two measuring beams (v<SUB>2</SUB>, v<SUB>3</SUB>) having at least defined frequencies with an approximately harmonic ratio. Interferometric phases are evaluated for the at least two measuring beams (v<SUB>2</SUB>, v<SUB>3</SUB>) at the outlet of said interferometer. The interferometric phases corresponding to the harmonic ratio of the frequencies of the measuring beams (v<SUB>2</SUB>, v<SUB>3</SUB>) are multiplicated and at least one phase difference of the thus formed phase value is examined. According to the invention, at least one of the measuring beams (v<SUB>3</SUB>) can be modified in the frequency thereof and a control signal which is used to modify the frequency of the measuring beam (v<SUB>3</SUB>) which can be modified in the frequency thereof is formed from the obtained phase difference and the measuring signal controls the frequency in such a manner that the phase difference in zero. It is also possible to determine the refractive index or the length measurement by measuring a frequency difference.
申请公布号 US7420689(B2) 申请公布日期 2008.09.02
申请号 US20040564449 申请日期 2004.06.24
申请人 BUNDESREPUBLIK DEUTSCHLAND, VERTR. DURCH DAS BUNDESMINISTERIUM FUR WIRTSCHAFT UND TECHNOLOGIE, DIESES VERTRETEN DURCH DEN PRASIDENTEN DER PHYSIKALISCH-TECHNISCHEN BUNDESANSTALT 发明人 BODERMANN BERND
分类号 G01B11/02;G01B9/02;G01N21/45 主分类号 G01B11/02
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