发明名称 |
Sequential scan based techniques to test interface between modules designed to operate at different frequencies |
摘要 |
According to an aspect of present invention, modules designed to operate with different frequency in functional (normal) mode are tested using a sequential scan based technique at the respective frequencies. In one embodiment the interface logic connecting the two modules is tested for at-speed performance (i.e., the same speed at which the interface would be operated in functional mode during normal operation).
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申请公布号 |
US7421634(B2) |
申请公布日期 |
2008.09.02 |
申请号 |
US20050160235 |
申请日期 |
2005.06.15 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
PUVVADA NAGA SATYA SRIKANTH;KRISHNAMOORTHY NIKILA;JAIN SANDEEP;ABRAHAM JAIS |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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