发明名称 FERROELECTRIC TRANSISTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the following problem: a conventional main ferroeletric memory has a complicated control circuit and a long cycle time in reading data, and it has difficulty in incorporating into a general-purpose IC, because the memory executes destructive readout of data and requires rewriting or has a matrix-arranged memory cell to be controlled to prevent the destruction of data. SOLUTION: A field effect transistor having ferroelectric thin films on P-type and N-type gate portions is connected to a power supply terminal so as to have a polarity opposite to a usual polarity, and an electrode of the other terminal and the gate electrode are connected to form an input/output terminal. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008192670(A) 申请公布日期 2008.08.21
申请号 JP20070022674 申请日期 2007.02.01
申请人 SEIKO EPSON CORP 发明人 HASHIMOTO MASAMI
分类号 H01L21/8246;G11C11/22;H01L21/8247;H01L27/105;H01L27/28;H01L29/788;H01L29/792;H01L51/05 主分类号 H01L21/8246
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