发明名称 POGO PIN BLOCK OF SEMICONDUCTOR TESTER
摘要 PROBLEM TO BE SOLVED: To achieve a pogo pin block of a semiconductor tester for equalizing a ground potential, and insulating peripheral components by each unit of the pogo pin block. SOLUTION: In the pogo pin block of the semiconductor tester, a body block and a connection block are stacked, coaxial probes and ground probes are embedded and attached to an attachment platform, and the connection block comprises an insulator. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008190976(A) 申请公布日期 2008.08.21
申请号 JP20070025041 申请日期 2007.02.05
申请人 YOKOGAWA ELECTRIC CORP 发明人 HIRONO MAMORU
分类号 G01R1/06;G01R31/28 主分类号 G01R1/06
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