发明名称 ELECTRONIC COMPONENT INSPECTION DEVICE, ELECTRONIC COMPONENT INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an electronic component inspection device capable of inspecting the output in a very short time while keeping the electronic components in the pressurized vessel in the state of the prescribed pressure and prescribed temperature. SOLUTION: The electronic components A are accommodated in the pressurized vessel and hermetically sealed for inspecting the outputs of output terminals of the electronic components. The pressurized vessels are composed of upper movable vessel 11 and a lower vessel 12 fixed under the upper moveable vessel 11. The upper moveable vessel 11 is raised from the position closely being in contact with the lower vessel 12 by the elevation means. Moreover, the pressurizing means is provided for securing the sealing of the lower opening by pressing the upper moveable vessel 11 in the state where the vessel 11 is mounted on the lower vessel 12. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008190893(A) 申请公布日期 2008.08.21
申请号 JP20070022889 申请日期 2007.02.01
申请人 AKIM KK 发明人 IMAI SHIYOUJIRO;KAMATA MASAHIRO
分类号 G01R31/26;G01L27/00 主分类号 G01R31/26
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