发明名称 SEMICONDUCTOR INTERLAYER-INSULATING FILM FORMING COMPOSITION, PREPARATION METHOD THEREOF, FILM FORMING METHOD, AND SEMICONDUCTOR DEVICE
摘要 A composition for forming a semiconductor interlayer insulation layer and a manufacturing method thereof, a method for forming the semiconductor interlayer insulation layer, and a semiconductor device are provided to obtain coating solution for forming a new porous layer and to obtain a semiconductor device of high performance and reliability having a porous layer therein. A composition for forming a semiconductor interlayer insulation layer includes silicon oxide group corpuscle and a chemical polysiloxane compound. The chemical polysiloxane compound forms silicon-oxygen-silicon boding between the silicon oxide group corpuscles through condensation during the formation of a layer to improve strength of a framework, which is formed of the silicon oxide group corpuscle. Each of the silicon oxide group corpuscles is a zeolite minute particle with zeolite species crystal. Each of the silicon oxide group corpuscles is a minute silica particle.
申请公布号 KR20080076834(A) 申请公布日期 2008.08.20
申请号 KR20080013937 申请日期 2008.02.15
申请人 SHIN-ETSU CHEMICAL CO., LTD.;MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 YAGIHASHI FUJIO;HAMADA YOSHITAKA;ASANO TAKESHI;OGIHARA TSUTOMU;IWABUCHI MOTOAKI;NAKAGAWA HIDEO;SASAGO MASARU
分类号 H01L21/31;H01L21/3205 主分类号 H01L21/31
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