发明名称 |
SEMICONDUCTOR INTERLAYER-INSULATING FILM FORMING COMPOSITION, PREPARATION METHOD THEREOF, FILM FORMING METHOD, AND SEMICONDUCTOR DEVICE |
摘要 |
A composition for forming a semiconductor interlayer insulation layer and a manufacturing method thereof, a method for forming the semiconductor interlayer insulation layer, and a semiconductor device are provided to obtain coating solution for forming a new porous layer and to obtain a semiconductor device of high performance and reliability having a porous layer therein. A composition for forming a semiconductor interlayer insulation layer includes silicon oxide group corpuscle and a chemical polysiloxane compound. The chemical polysiloxane compound forms silicon-oxygen-silicon boding between the silicon oxide group corpuscles through condensation during the formation of a layer to improve strength of a framework, which is formed of the silicon oxide group corpuscle. Each of the silicon oxide group corpuscles is a zeolite minute particle with zeolite species crystal. Each of the silicon oxide group corpuscles is a minute silica particle. |
申请公布号 |
KR20080076834(A) |
申请公布日期 |
2008.08.20 |
申请号 |
KR20080013937 |
申请日期 |
2008.02.15 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD.;MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
YAGIHASHI FUJIO;HAMADA YOSHITAKA;ASANO TAKESHI;OGIHARA TSUTOMU;IWABUCHI MOTOAKI;NAKAGAWA HIDEO;SASAGO MASARU |
分类号 |
H01L21/31;H01L21/3205 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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