发明名称 |
A REPAIRABLE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF REPAIRING THE SAME |
摘要 |
A repairable semiconductor memory device including a memory cell array having a first block to store first system data and a second block to store second system data identical to the first system data. A controller transmits the first system data to a memory unit in response to a reset signal output from a host and the second system data to the memory unit based on a fail detection signal generated by an ECC detection block. The ECC detection block determines whether the first system data is defective. When a defect is generated in the first system data during resetting of the semiconductor memory device, the first system data is repaired by supplying the second system data.
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申请公布号 |
US2008195893(A1) |
申请公布日期 |
2008.08.14 |
申请号 |
US20070845194 |
申请日期 |
2007.08.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE BYEONG HOON;KIM KI HONG;LEE SEUNG WON;KIM SUN KWON |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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