发明名称 A REPAIRABLE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF REPAIRING THE SAME
摘要 A repairable semiconductor memory device including a memory cell array having a first block to store first system data and a second block to store second system data identical to the first system data. A controller transmits the first system data to a memory unit in response to a reset signal output from a host and the second system data to the memory unit based on a fail detection signal generated by an ECC detection block. The ECC detection block determines whether the first system data is defective. When a defect is generated in the first system data during resetting of the semiconductor memory device, the first system data is repaired by supplying the second system data.
申请公布号 US2008195893(A1) 申请公布日期 2008.08.14
申请号 US20070845194 申请日期 2007.08.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE BYEONG HOON;KIM KI HONG;LEE SEUNG WON;KIM SUN KWON
分类号 G06F11/00 主分类号 G06F11/00
代理机构 代理人
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