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发明名称
CIRCUIT FOR IMPROVED TEST AND CALIBRATION IN AUTOMATED TEST EQUIPMENT.
摘要
申请公布号
EP1373909(B1)
申请公布日期
2008.08.13
申请号
EP20020713739
申请日期
2002.03.02
申请人
TERADYNE, INC.
发明人
HAUPTMAN, STEVEN
分类号
G01R31/28;G01R31/319;G01R35/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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