发明名称 Plasma-enhanced ALD of tantalum nitride films
摘要 <p>Methods of controllably producing conductive tantalum nitride films are provided. The methods comprise contacting a substrate in a reaction space with alternating and sequential pulses of a tantalum source material, plasma-excited species of hydrogen and nitrogen source material. The plasma-excited species of hydrogen reduce the oxidation state of tantalum, thereby forming a substantially conductive tantalum nitride film over the substrate. In some embodiments, the plasma-excited species of hydrogen react with and removes halide residues in a deposited metallic film.</p>
申请公布号 EP1956113(A1) 申请公布日期 2008.08.13
申请号 EP20080000724 申请日期 2008.01.16
申请人 ASM AMERICA, INC. 发明人 ELERS, KAI-ERIK
分类号 C23C16/455;C23C16/30 主分类号 C23C16/455
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