发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve the area efficiency of an ESD protection circuit which uses a bipolar transistor. SOLUTION: An integrated circuit includes an inner circuit 121 which contains a bipolar transistor 124 for the circuit and a protection bipolar transistor 120 for protecting the inner circuit 121 from surges, wherein the emitter and base of the protection bipolar transistor 120 are short-circuited. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008182140(A) 申请公布日期 2008.08.07
申请号 JP20070015875 申请日期 2007.01.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHINDO MASAO
分类号 H01L27/06;H01L21/331;H01L21/822;H01L21/8222;H01L27/04;H01L29/732 主分类号 H01L27/06
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