发明名称 |
System and Method for Determining a Guard Band for an Operating Voltage of an Integrated Circuit Device |
摘要 |
A system and method for determining a guard band for an operating voltage of an integrated circuit device are provided. The system and method provide a mechanism for calculating the guard band based on a comparison of simulated noise obtained from a simulation of the integrated circuit device using a worst case waveform stimuli with simulated or measured power supply noise of a workload/test pattern that may be achieved using testing equipment. A scaling factor for the guard band is determined by comparing results of a simulation of a workload/test pattern with measured results of the workload/test pattern as applied to a hardware implementation of the integrated circuit device. This scaling factor is applied to a difference between the noise generated through simulation of the workload/test pattern and the noise generated through simulation of the worst case current waveform to generate a guard band value.
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申请公布号 |
US2008189090(A1) |
申请公布日期 |
2008.08.07 |
申请号 |
US20070671852 |
申请日期 |
2007.02.06 |
申请人 |
AIKAWA MAKOTO;DHONG SANG H;FLACHS BRIAN;GERVAIS GILLES;NISHINO YOICHI;TAKIGUCHI IWAO;TAMURA TETSUJI;ZHOU YAPING |
发明人 |
AIKAWA MAKOTO;DHONG SANG H.;FLACHS BRIAN;GERVAIS GILLES;NISHINO YOICHI;TAKIGUCHI IWAO;TAMURA TETSUJI;ZHOU YAPING |
分类号 |
G06G7/62;G06F17/50 |
主分类号 |
G06G7/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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