| 摘要 |
The existence of physicochemical variables in semiconductor components, such as the edge effect, the ion implantation, the surface state effect, and the variation in charge carrier mobility, is exploited in a method for manufacturing random serial number for integrated circuits. The physicochemical variables are measured with a high gain amplification circuit and then converted into digital signal. Owing to the randomness of variation of the measured physicochemical variables in semiconductor components, multiple random serial numbers are generated by using multiple amplification circuit units.
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