发明名称 Inspection data producing method and board inspection apparatus using the method
摘要 After a CAD data and a parts library are combined to produce an inspection data, the set data for the inspection window is automatically corrected using the image of a bare board for a board to be inspected. In this correcting process, an inspection window based on the aforementioned inspection data is set on a bare board image, and then an image in the inspection window W 4 making up a reference for setting other windows is binarized, and lands 35 on this binary image are detected. Further, on the basis of the detection result, the set position and size of land windows W 1 for solder inspection are corrected, after which the set positions of other inspection windows W 2 to W 4 are corrected.
申请公布号 US7406191(B2) 申请公布日期 2008.07.29
申请号 US20030633594 申请日期 2003.08.05
申请人 OMRON CORPORATION 发明人 FUJII YOSHIKI;SUGIYAMA TOSHIYUKI
分类号 G06K9/00;G01N21/88;G01N21/956;G01R31/28;G01R31/309;H05K3/00;H05K13/08 主分类号 G06K9/00
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