发明名称 TEST CHAMBER APPARATUS
摘要 <p>TEST CHAMBER APPARATUS Ina test chamber apparatus, to maintain sealing capability of a depressurized space where a test subject device is placed and to accurately control air pressure in the depressurized space. [Solving Means] In a preferred embodiment of the present invention, a depressurized space 202 and a space 204 are separated by a connection board 205. The connection board 205 transmits signals between a test computer 300a and an HDD 100a. The connection board 205 is fixed to an inner wall 208 defining the depressurized space 202 and the space 204. An opening 207 is formed on the inner wall 208. The connection board 205 which is larger than the opening 207 covers the opening 207. To maintain the air sealing property in the depressurized space 202, the connection board 205 is fixed to the inner wall 208 via a gasket 206.</p>
申请公布号 SG144132(A1) 申请公布日期 2008.07.29
申请号 SG20080000200 申请日期 2008.01.04
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B. 发明人 KUWASHIMA MASAKI;TAKEDA NOBUO;TSUYAMA MASASHI;NISHIUCHI SHIGETO
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