发明名称 MASS ANALYZING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a mass analyzing system capable of accurately obtaining the data of a measuring object required by a user, with high efficiency. SOLUTION: In a tandem-type mass analyzing system, a database is searched in relation to the first parameter of precursor ions for MS<SP>1</SP>mass analysis, when the intensity of the peak ions of an MS<SP>1</SP>mass spectrum is a predetermined threshold or higher, when the candidate of precursor ions for MS<SP>2</SP>mass analysis is selected to determine whether the ions are stored in the data base. When the intensity of the peak ions of the MS<SP>1</SP>mass spectrum is lower than the predetermined threshold, the database is searched in relation to a second parameter that is smaller than the first parameter, to determine whether the peak ions are stored in the database and the ions that are not stored in the database are selected as the candidate of the precursor ions for the MS<SP>2</SP>mass analysis. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008170260(A) 申请公布日期 2008.07.24
申请号 JP20070003387 申请日期 2007.01.11
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YOKOSUKA TOSHIYUKI;YOSHINARI KIYOMI;KOBAYASHI KINYA
分类号 G01N27/62;H01J49/26 主分类号 G01N27/62
代理机构 代理人
主权项
地址