发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a three-dimensionally structured gate insulating film which can easily deal with miniaturization of a gate structure and be easily manufactured. <P>SOLUTION: This semiconductor device has a structure in which a three-dimensionally structured gate insulating film is formed on a semiconductor substrate, a gate electrode contacting the gate insulating film is protrudingly formed on the semiconductor substrate, a source electrode and a drain electrode are formed on the semiconductor substrate around the gate insulating film via a diffusion layer region of the semiconductor substrate, the upper surface of the semiconductor substrate around the gate electrode is covered with a protective insulating film for covering the side surface of the gate electrode protrudingly formed on the semiconductor substrate, and an interlayer insulating film is laminated on the protective insulating film. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008171872(A) 申请公布日期 2008.07.24
申请号 JP20070001335 申请日期 2007.01.09
申请人 ELPIDA MEMORY INC 发明人 MIKASA NORIAKI
分类号 H01L29/78;H01L21/28;H01L21/336;H01L21/8242;H01L27/108;H01L29/423;H01L29/49 主分类号 H01L29/78
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