PARALLEL BIT TEST APPARATUS CAPABLE OF REDUCING TEST TIME AND METHOD THEREOF

摘要

A PBT(Parallel Bit Test) apparatus and a method thereof are provided to reduce test cost by decreasing test time. According to a parallel bit test(PBT) apparatus comprised in each chip stacked in a multi chip package, a comparison part(420) outputs a representative data signal by judging consistency of a data signal inputted to perform a parallel bit test. A coding part(450) outputs the representative data signal to a desired data signal line, in response to a first test MRS signal. The first test MRS signal controls so that representative data signals outputted from each coding part comprised in the chip are outputted from different data signal line.