发明名称 PHYSICAL ALIGNMENT FEATURES ON INTEGRATED CIRCUIT DEVICES FOR ACCURATE DIE-IN-SUBSTRATE EMBEDDING
摘要 A method of packaging an integrated circuit die including forming a mask window having a first aperture with a first set of alignment edges and forming an alignment feature on an uppermost surface of the integrated circuit die where the alignment feature has a second set of alignment edges. The alignment feature is inserted into the first aperture. The integrated circuit die is mechanically biased until the first and second set of alignment edges are in physical contact with one another and the alignment feature is secured into the mask window, thus forming an integrated circuit die assembly.
申请公布号 US2008160670(A1) 申请公布日期 2008.07.03
申请号 US20060616479 申请日期 2006.12.27
申请人 ATMEL CORPORATION 发明人 LAM KEN M.
分类号 H01L21/00 主分类号 H01L21/00
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