| 摘要 |
A semiconductor memory and a method for operating the semiconductor memory are provided to improve test efficiency, by performing only refresh operation required in a test without installing a dedicated test port. A memory cell array has a dynamic memory cell. An access control circuit(10) accesses to the memory cell in response to an access command supplied from the outside. A refresh mask port receives a refresh mask signal supplied together with the access command. A refresh control circuit(12) generates a test refresh request signal by being synchronized with the access command in order to perform refresh operation of the memory cell, when the refresh mask signal has an invalid level, and prohibits the generation of the test refresh request signal when the refresh mask signal has a valid level, during a test mode.
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