发明名称 SEQUENTIAL MEMORY AND ACCESSING METHOD THEREOF
摘要 A method for accessing a memory sequentially. The memory has (m+1) bit lines and at least one row of transistors, wherein m is a positive integer. This method includes the following steps. First, voltage levels of first and second terminals of the transistors are equalized to a ground voltage in a pre-discharge period. Next, the voltage levels of the first and second terminals of the n<SUP>th </SUP>transistor are respectively transformed into a source voltage and a drain voltage in an n<SUP>th </SUP>reading period, and the voltage level of the second terminal of the (n+<SUB>1</SUB>)<SUP>th </SUP>transistor is transformed into an isolation voltage, wherein n is a positive integer smaller than m. Thereafter, the voltage levels of the first and second terminals of the m<SUP>th </SUP>transistor are respectively transformed into the source voltage and the drain voltage in an m<SUP>th </SUP>reading period. The source voltage equals the ground voltage.
申请公布号 US2008159060(A1) 申请公布日期 2008.07.03
申请号 US20060645708 申请日期 2006.12.27
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN CHANG-TING;CHEN CHUNG-KUANG
分类号 G11C8/00 主分类号 G11C8/00
代理机构 代理人
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